Variation between two different contact angle measurements on the same

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Christine DUPONT, Université Catholique de Louvain - UCLouvain, Louvain-la-Neuve, UCLouvain

Le Quan Ngoc TRAN, Research Scientist, Singapore Institute of Manufacturing Technology (SIMTech), Singapore

Carlos FUENTES, Senior R&T Associate, PhD, Luxembourg Institute of Science and Technology (LIST), Esch-sur-Alzette, LIST, Materials Research and Technology (MRT)

Christine DUPONT, Université Catholique de Louvain - UCLouvain, Louvain-la-Neuve, UCLouvain

Christine DUPONT, Université Catholique de Louvain - UCLouvain, Louvain-la-Neuve, UCLouvain

Steven FEYTER, Head of Department, PhD, KU Leuven, Leuven, ku leuven, Department of Chemistry

Willem VANDERLINDEN, Reader, The University of Edinburgh, Edinburgh, UoE, School of Physics and Astronomy

Christine DUPONT, Université Catholique de Louvain - UCLouvain, Louvain-la-Neuve, UCLouvain

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